MEO Engineering CompanY

MEO Engineering CompanYMEO Engineering CompanYMEO Engineering CompanY

vray@partbeamsystech.com

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    • GALEX INSTRUMENTS
    • HIGH TEMPERATURE PRODUCTS
    • PBS&T™
    • HIGH VOLTAGE PRODUCTS
    • FIB/SEM PRECURSORS
    • ION & ELECTRON OPTICS
  • FIB/SEM LAB SERVICES
    • SUPPORT & UPGRADES
    • OPERATOR TRAINING
    • SERVICE TRAINING
  • ABOUT US
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    • DISTRIBUTORS
    • RATES & TERMS
  • Contact Us
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    • HOME
    • PRODUCTS
      • GALEX INSTRUMENTS
      • HIGH TEMPERATURE PRODUCTS
      • PBS&T™
      • HIGH VOLTAGE PRODUCTS
      • FIB/SEM PRECURSORS
      • ION & ELECTRON OPTICS
    • FIB/SEM LAB SERVICES
      • SUPPORT & UPGRADES
      • OPERATOR TRAINING
      • SERVICE TRAINING
    • ABOUT US
      • CUSTOMERS
      • DISTRIBUTORS
      • RATES & TERMS
    • Contact Us

MEO Engineering CompanY

MEO Engineering CompanYMEO Engineering CompanYMEO Engineering CompanY

vray@partbeamsystech.com

  • HOME
  • PRODUCTS
  • FIB/SEM LAB SERVICES
  • ABOUT US
  • Contact Us

High Focused Ion Beam Technology on a Small Scale Since 2004

High Focused Ion Beam Technology on a Small Scale Since 2004High Focused Ion Beam Technology on a Small Scale Since 2004High Focused Ion Beam Technology on a Small Scale Since 2004

PBS&T is a third-party provider of service, upgrades, spare parts, consumables, and process development support for broad range of particle beam instrumentation, including Focused Ion Beam (FIB) systems manufactured by former Micrion Company, FIB and FIB/SEM equipment manufactured by FEI Company, Scanning Electron Microscopy (SEM) tools from various SEM manufacturers including industrial CD-SEM and DR-SEM tools made by Opal and Applied Materials.

Contact Us

High Focused Ion Beam Technology on a Small Scale Since 2004

High Focused Ion Beam Technology on a Small Scale Since 2004High Focused Ion Beam Technology on a Small Scale Since 2004High Focused Ion Beam Technology on a Small Scale Since 2004

PBS&T is a third-party provider of service, upgrades, spare parts, consumables, and process development support for broad range of particle beam instrumentation, including Focused Ion Beam (FIB) systems manufactured by former Micrion Company, FIB and FIB/SEM equipment manufactured by FEI Company, Scanning Electron Microscopy (SEM) tools from various SEM manufacturers including industrial CD-SEM and DR-SEM tools made by Opal and Applied Materials.

Contact Us

PRODUCTS

GALEX Instruments®

High Temperature Technologies™

High Temperature Technologies™

Gas Injection Systems for precursor delivery in FIB and SEM in-situ  Gas-Assisted Etching and Beam-Induced Deposition Applications,

 Micromanipulation and Temperature Control

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High Temperature Technologies™

High Temperature Technologies™

High Temperature Technologies™

Laboratory furnaces, high and ultra-high temperature up to 2400°C (4352°F) in vacuum and gas atmosphere in graphite environment with rapid heating rates  up to 100°C/Sec 

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PBS&T™

High Temperature Technologies™

High Voltage FIB/SEM Gun Power

Consumable Parts, Service and Support for FIB and SEM Users

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High Voltage FIB/SEM Gun Power

High Voltage FIB/SEM Gun Power

High Voltage FIB/SEM Gun Power

Service consumables (extractors, suppressors, shields, apertures) and Gas Injection System accessories for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), and dual-beam FIB/SEM systems.

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FIB/SEM Precursors

High Voltage FIB/SEM Gun Power

Ion and Electron Optics

FIB/SEM Precursors for Etching and Deposition Chemistry

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Ion and Electron Optics

High Voltage FIB/SEM Gun Power

Ion and Electron Optics

Ion and Electron Optics for Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) Columns

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FIB/SEM LAB SERVICES

Support, Repair & Upgrades

Support, Repair & Upgrades

Support, Repair & Upgrades

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Operator Training

Support, Repair & Upgrades

Support, Repair & Upgrades

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Service Training

Support, Repair & Upgrades

Service Training

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Disclaimer

MEO Engineering Company, Inc., D.B.A. "PBS&T" ("Particle Beam Systems and Technology") provides range of technological solutions, including third-party service, support, parts, and consumables for FIB, SEM, and dual-beam FIB/SEM instrumentation. PBS&T does not represent, not affiliated with, and not supported by OEMs of FIB, SEM, and FIB/SEM instrumentation. All trademarks identifying supported FIB, SEM, and FIB/SEM equipment and components are property of their respective owners and nominatively used for the sole purpose of accurately identifying equipment compatible with the parts and services provided by PBS&T, MEO Engineering Company, Inc. 

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Suite 298
Methuen, MA 01844
vray@partbeamsystech.com

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MEO Engineering Company, Inc. All rights reserved.