High Focused Ion Beam Technology on a Small Scale Since 2004
PBS&T is a third-party provider of service, upgrades, spare parts, consumables, and process development support for broad range of particle beam instrumentation, including Focused Ion Beam (FIB) systems manufactured by former Micrion Company, FIB and FIB/SEM equipment manufactured by FEI Company, Scanning Electron Microscopy (SEM) tools from various SEM manufacturers including industrial CD-SEM and DR-SEM tools made by Opal and Applied Materials.
High Focused Ion Beam Technology on a Small Scale Since 2004
PBS&T is a third-party provider of service, upgrades, spare parts, consumables, and process development support for broad range of particle beam instrumentation, including Focused Ion Beam (FIB) systems manufactured by former Micrion Company, FIB and FIB/SEM equipment manufactured by FEI Company, Scanning Electron Microscopy (SEM) tools from various SEM manufacturers including industrial CD-SEM and DR-SEM tools made by Opal and Applied Materials.
