PRODUCTS

GALEX Instruments®

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Gas Injection Systems for precursor delivery in FIB and SEM in-situ  Gas-Assisted Etching and Beam-Induced Deposition Applications,

 Micromanipulation and Temperature Control

High Temperature Technologies™

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Laboratory furnaces, high and ultra-high temperature up to 2400°C (4352°F) in vacuum and gas atmosphere in graphite environment with rapid heating rates  up to 100°C/Sec 

PBS&T™

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Consumable Parts, Service and Support for FIB and SEM Users

High Voltage FIB/SEM Gun Power

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Service consumables (extractors, suppressors, shields, apertures) and Gas Injection System accessories for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), and dual-beam FIB/SEM systems.

FIB/SEM Precursors

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FIB/SEM Precursors for Etching and Deposition Chemistry

Ion and Electron Optics

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Ion and Electron Optics for Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) Columns

FIB/SEM LAB SERVICES

Disclaimer

MEO Engineering Company, Inc., D.B.A. "PBS&T" ("Particle Beam Systems and Technology") provides range of technological solutions, including third-party service, support, parts, and consumables for FIB, SEM, and dual-beam FIB/SEM instrumentation. PBS&T does not represent, not affiliated with, and not supported by OEMs of FIB, SEM, and FIB/SEM instrumentation. All trademarks identifying supported FIB, SEM, and FIB/SEM equipment and components are property of their respective owners and nominatively used for the sole purpose of accurately identifying equipment compatible with the parts and services provided by PBS&T, MEO Engineering Company, Inc.