Gas Injection Systems for precursor delivery in FIB and SEM in-situ Gas-Assisted Etching and Beam-Induced Deposition Applications,
Micromanipulation and Temperature Control
Laboratory furnaces, high and ultra-high temperature up to 2400°C (4352°F) in vacuum and gas atmosphere in graphite environment with rapid heating rates up to 100°C/Sec
Consumable Parts, Service and Support for FIB and SEM Users
Service consumables (extractors, suppressors, shields, apertures) and Gas Injection System accessories for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), and dual-beam FIB/SEM systems.
Ion and Electron Optics for Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) Columns